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IEC 61032 Test Probe B

Name: IEC 61032 Test Probe B
Brand: HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD
SKU: HT-I02
Availability: InStock

Brand Name:	HeJin
Model Number:	HT-I02
MOQ:	1 Set
Price:	Negotiatable
Payment Terms:	T/T, L/C
Supply Ability:	30 sets / per month

Detail Information

Product Description

Ratings & Reviews

Detail Information

Place of Origin:

China

Certification:

calibration certificate (cost additional)

Product Name:

Test Finger Probe B HT-I02

Usage:

Access Probes Of IEC 60529 (IP Code)

Probe Code:

B, Test Finger Probe

Description:

Jointed Test Finger

Standard:

IEC 61032, IEC 60529-1, IEC 60335-1

Material:

Nylon Handle + Stainless Steel Finger

Finger Length:

80mm

Baffle Diameter:

Ф75mm

Packaging Details:

Cartoon Box

Highlight:

IEC 61032 Test Probe B

IEC 61032 Probe B

Test Probe B IEC 61032

Product Description

IEC61032 Test Finger Probe Figure 2 Test Probe B 80mm Finger Length

Standard:

IEC 61032 ‘Protection of persons and equipment by enclosures – Probes for verification’ figure 2 test probe B.

IEC 60529 Degrees of protection provided by enclosures (IP Code) IP2X

IEC 60335-1 ‘Household and similar electrical appliances – Safety – Part 1: General requirements’

Application:

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Access probes of IEC 60529 (IP code) to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.

Feature:

It has two movable joints, which can be curved at 90°. Can be used with a electrical indicator.

A hole (M6) can be made at the end of the handle for connection with a push-pull gauge. The model with ‘T’ means that this model is with force.

Parameter:

Model	HT-I02	HT-I02A	HT-I02B	HT-I02T
Name	Standard Test Finger Test Finger Probe	Circular Baffle Test finger	Large Baffle Test Finger	Standard Test Finger With Force
Joint 1	30±0.2	30±0.2	30±0.2	30±0.2
Joint 2	60±0.2	60±0.2	60±0.2	60±0.2
Finger length	80±0.2	80±0.2	100±0.2	80±0.2
Fingertip to baffle	180±0.2	180±0.2	----	180±0.2
Cylindrical	R2±0.05	R2±0.05	R2±0.05	R2±0.05
Spherical	R4±0.05	R4±0.05	R4±0.05	R4±0.05
Fingertip cutting bevel angle	37o 0 -10′	37o 0 -10′	37o 0 -10′	37o 0 -10′
Fingertip taper	14 o 0 -10′	14 o 0 -10′	14 o 0 -10′	14 o 0 -10′
Test finger diameter	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05
A-A Section diameter	Ф50	Ф50	----	Ф50
A-A Section width	20±0.2	----	----	20±0.2
Baffle diameter	Ф75±0.2	Ф75±0.2	Ф125±0.2	Ф75±0.2
Baffle thickness	5±0.5	5±0.5	----	5±0.5
Force	----	----	----	With force 0-50N
Applied standard	IEC61032-1	IEC60335-1	IEC60335-2-14	IEC60529-1

IEC 61032 Test Probe B 0 IEC 61032 Test Probe B 1

Ratings & Review

Overall Rating

5.0

Based on 50 reviews for this supplier

Rating Snapshot

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products details

IEC 61032 Test Probe B

IEC 61032 Test Probe B

IEC 61032 Test Probe B

IEC 61032 Probe B

Test Probe B IEC 61032

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