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IEC 61032 Test Probe B

Name: IEC 61032 Test Probe B
Brand: HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD
SKU: HT-I02
Availability: InStock

Brand Name:	HeJin
Model Number:	HT-I02
MOQ:	1 set
Price:	Negotiatable
Payment Terms:	L/C, T/T
Supply Ability:	30 sets / per month

Detail Information

Product Description

Detail Information

Place of Origin:

China

Certification:

calibration certificate (cost additional)

Product Name:

Test Finger Probe B HT-I02

Usage:

Access Probes Of IEC 60529 (IP Code)

Probe Code:

B, Test Finger Probe

Description:

Jointed Test Finger

Standard:

IEC 61032, IEC 60529-1, IEC 60335-1

Material:

Nylon Handle + Stainless Steel Finger

Finger Length:

80mm

Baffle Diameter:

Ф75mm

Packaging Details:

Cartoon Box

Highlight:

IEC 61032 Test Probe B

IEC 61032 Probe B

Test Probe B IEC 61032

Product Description

IEC61032 Test Finger Probe Figure 2 Test Probe B 80mm Finger Length

Standard:

IEC 61032 ‘Protection of persons and equipment by enclosures – Probes for verification’ figure 2 test probe B.

IEC 60529 Degrees of protection provided by enclosures (IP Code) IP2X

IEC 60335-1 ‘Household and similar electrical appliances – Safety – Part 1: General requirements’

Application:

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Access probes of IEC 60529 (IP code) to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.

Feature:

It has two movable joints, which can be curved at 90°. Can be used with a electrical indicator.

A hole (M6) can be made at the end of the handle for connection with a push-pull gauge. The model with ‘T’ means that this model is with force.

Parameter:

Model	HT-I02	HT-I02A	HT-I02B	HT-I02T
Name	Standard Test Finger Test Finger Probe	Circular Baffle Test finger	Large Baffle Test Finger	Standard Test Finger With Force
Joint 1	30±0.2	30±0.2	30±0.2	30±0.2
Joint 2	60±0.2	60±0.2	60±0.2	60±0.2
Finger length	80±0.2	80±0.2	100±0.2	80±0.2
Fingertip to baffle	180±0.2	180±0.2	----	180±0.2
Cylindrical	R2±0.05	R2±0.05	R2±0.05	R2±0.05
Spherical	R4±0.05	R4±0.05	R4±0.05	R4±0.05
Fingertip cutting bevel angle	37o 0 -10′	37o 0 -10′	37o 0 -10′	37o 0 -10′
Fingertip taper	14 o 0 -10′	14 o 0 -10′	14 o 0 -10′	14 o 0 -10′
Test finger diameter	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05
A-A Section diameter	Ф50	Ф50	----	Ф50
A-A Section width	20±0.2	----	----	20±0.2
Baffle diameter	Ф75±0.2	Ф75±0.2	Ф125±0.2	Ф75±0.2
Baffle thickness	5±0.5	5±0.5	----	5±0.5
Force	----	----	----	With force 0-50N
Applied standard	IEC61032-1	IEC60335-1	IEC60335-2-14	IEC60529-1

IEC 61032 Test Probe B 0 IEC 61032 Test Probe B 1

Tags:

Auto Parts Test Equipment

Leak Testing Equipment

IP Test Equipment

Automatic Brazing Machine

Mechanical Strength Test

IEC Test Equipment

Flammability Testing Equipment

Impact Testing Machine

Plug Socket Test Equipment

Test Finger Probe

Household Appliance Test Equipment

Appliance Performance Test Lab

Vacuum Testing Equipment

Vacuum Furnace

Vacuum Coating Machine

Auto Parts Test Equipment

Leak Testing Equipment

IP Test Equipment

Automatic Brazing Machine

Mechanical Strength Test

IEC Test Equipment

Flammability Testing Equipment

Impact Testing Machine

Plug Socket Test Equipment

Test Finger Probe

Household Appliance Test Equipment

Appliance Performance Test Lab

Vacuum Testing Equipment

Vacuum Furnace

Vacuum Coating Machine

products details

IEC 61032 Test Probe B

IEC 61032 Test Probe B

IEC 61032 Test Probe B

IEC 61032 Probe B

Test Probe B IEC 61032