| Brand Name: | HJ | 
| Model Number: | HT-IPX1-4 | 
| MOQ: | 1 set | 
| Price: | Negotiatable | 
| Payment Terms: | T/T, L/C | 
| Supply Ability: | 20 set per month | 
IP Test Equipment Access Probes For The Tests For Degrees Of Protection By IP1X To IP4X
Standard:
IEC 60529 Degrees of protection provided by enclosures (IP Code) IP1X, IP2X, IP3X, IP4X
Application:
It is used to indicate the degrees of protection provided by an enclosure against access to hazardous parts, ingress of solid foreign objects.
Parameter:
It is concluded to the following test probes according to the degree of protection provided by an enclosure is indicated by the IP Code:


| Model | HT-I01 | 
| Name | Test probe A | 
| Rigid test ball diameter (metal) | SФ50+0.05 0 | 
| Baffle diameter (nylon) | Ф45±0.2 | 
| Baffle thickness | 4 | 
| Handle diameter | Ф10 | 
| Handle length (nylon) | 100 | 
| Force | ---- | 
| Model | HT-I02 | 
| Name | Standard Test Finger | 
| Joint 1 | 30±0.2 | 
| Joint 2 | 60±0.2 | 
| Finger length | 80±0.2 | 
| Fingertip to baffle | 180±0.2 | 
| Cylindrical | R2±0.05 | 
| Spherical | R4±0.05 | 
| Fingertip cutting bevel angle | 37o 0 -10′ | 
| Fingertip taper | 14 o 0 -10′ | 
| Test finger diameter | Ф12 0 -0.05 | 
| A-A Section diameter | Ф50 | 
| A-A Section width | 20±0.2 | 
| Baffle diameter | Ф75±0.2 | 
| Baffle thickness | 5±0.5 | 
| Force | ---- | 
| Model | HT-I03 | 
| Name | Test rod probe C | 
| Probe diameter | Ф2.5+0.05 0 | 
| Sphere diameter | SФ35±0.2 | 
| Handle diameter | Ф10 | 
| Probe length | 100±0.2 | 
| Handle length | 100 | 
| Force | ---- | 
| Model | HT-I04 | 
| Name | Test rod probe D | 
| Diameter of the metal wire | Ф1+0.05 0 | 
| Sphere diameter | SФ35±0.2 | 
| Handle diameter | Ф10 | 
| Probe length | 100±0.2 | 
| Handle length | 100 | 
| Force | ---- |