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IP Test Equipment
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Rustproof Ingress Protection Test Equipment Access Probes

Rustproof Ingress Protection Test Equipment Access Probes

Brand Name: HeJin
Model Number: HT-IPX1-4
MOQ: 1 Set
Price: Negotiatable
Supply Ability: 20 set per month
Detail Information
Place of Origin:
China
Certification:
calibration certificate (cost additional)
Usage:
Tests For Protection Of Persons Against Access To Hazardous Parts
Application:
Test Conditions For Degrees Of Protection Indicated By The First Characteristic Numeral 1,2,3,4
Function:
Tests For Protection Against Solid Foreign Objects Indicated By The First Characteristic Numeral
Material:
Stainless Steel And Nylon
Packaging Details:
Carton Box
Highlight:

Ingress Protection Test Equipment Access Probes

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Rustproof Test Equipment Access Probes

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Rustproof Ingress Protection Test Access Probes

Product Description

IP Test Equipment Access Probes For The Tests For Degrees Of Protection By IP1X To IP4X

 

Standard:

IEC 60529 Degrees of protection provided by enclosures (IP Code) IP1X, IP2X, IP3X, IP4X

 

Application:

It is used to indicate the degrees of protection provided by an enclosure against access to hazardous parts, ingress of solid foreign objects.

 

Parameter:

It is concluded to the following test probes according to the degree of protection provided by an enclosure is indicated by the IP Code:

  1. Test Sphere Probe HT-I01, Sphere 50 mm diameter, test force 50N±10 %
  2. Test Finger Probe B HT-I02, Jointed test finger, test force 10N±10 %
  3. Test Rod Probe C HT-I03, Test rod 2.5 mm diameter, 100 mm long, test force 3N± 10 %
  4. Test Rod Probe D HT-I04, Test rod 1.0 mm diameter, 100 mm long, test force 1N± 10 %

Rustproof Ingress Protection Test Equipment Access Probes 0

Rustproof Ingress Protection Test Equipment Access Probes 1

Model HT-I01
Name Test probe A
Rigid test ball diameter (metal) SФ50+0.05 0
Baffle diameter (nylon) Ф45±0.2
Baffle thickness 4
Handle diameter Ф10
Handle length (nylon) 100
Force ----
Model HT-I02
Name Standard Test Finger
Joint 1 30±0.2
Joint 2 60±0.2
Finger length 80±0.2
Fingertip to baffle 180±0.2
Cylindrical R2±0.05
Spherical R4±0.05
Fingertip cutting bevel angle 37o 0 -10′
Fingertip taper 14 o 0 -10′
Test finger diameter Ф12 0 -0.05
A-A Section diameter Ф50
A-A Section width 20±0.2
Baffle diameter Ф75±0.2
Baffle thickness 5±0.5
Force ----
Model HT-I03
Name Test rod probe C
Probe diameter Ф2.5+0.05 0
Sphere diameter SФ35±0.2
Handle diameter Ф10
Probe length 100±0.2
Handle length 100
Force ----
Model HT-I04
Name Test rod probe D
Diameter of the metal wire Ф1+0.05 0
Sphere diameter SФ35±0.2
Handle diameter Ф10
Probe length 100±0.2
Handle length 100
Force ----